The movement of atoms through a material can cause problems under certain circumstances. Atomic-resolution electron microscopy has enabled researchers at Linköping University in Sweden to observe for ...

There are many microscopy techniques out there, each different to the last. However, there is a new form of microscopy available on the marketplace known as photo-induced force microscopy (PiFM), ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

The efforts of microscopists have given aberration-corrected transmission electron microscopy the power to reveal atomic structures with unprecedented precision. It is now up to materials scientists ...

Scientists have developed a computational technique that greatly increases the resolution of atomic force microscopy, a specialized type of microscope that 'feels' the atoms at a surface. The method ...

Atomic Force Microscopy (AFM) is a type of high-resolution scanning probe microscopy that allows for imaging, manipulation, and force measurement. Atomic Force Microscopy was first developed in 1986 ...

(Nanowerk News) A high-power atomic force microscope that could revolutionize the study of materials at high temperatures and pressures is coming into focus in a Wright State University lab. Steven ...

The above image is a photo of a pentacene molecule. Not a drawing. A photo. Taken by researchers at IBM’s Zurich lab. The tip of this microscope employs one oxygen atom bonded to one carbon atom. It’s ...

Atomic force microscopy (AFM), a form of scanning probe microscopy, is a technique where a cantilever with a sharp tip is systematically scanned across a sample (biological or material) surface to ...

The following sections cover the basic concepts and technologies that underpin the construction and operation of an atomic force microscope. An atomic force microscope is optimized for measuring ...

One of the most important acronyms in nanotechnology is AFM – Atomic Force Microscopy. This instrument has become the most widely used tool for imaging, measuring and manipulating matter at the ...

This article serves as a basic introduction to the design and operation of an atomic force microscope. The following sections cover the basic concepts and technologies that help understand the ...