Santa Cruz, Calif. — Think your "smart" credit cards are safe from hackers, that your company firewall is secure and that no one can steal the intellectual property in your latest chip design? Think ...

For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

Scan technology enables high levels of defect detection using automated tools. Each D flip-flop (DFF) or latch in the circuit under test is implemented as an equivalent sequential element called a ...

For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...