On the other hand, Gallium focused ion beam (FIB) milling can only reasonably produce cross-sections of samples that are 20 ...

Since the 1950s, scientists have worked around this problem by coating samples with a thin layer of gold before imaging. While this approach made electron microscopy possible for countless discoveries ...

insights from industryDr. Anna WalkiewiczApplications SpecialistQuorum Technologies In this interview, AZoM talks to Anna Walkiewicz, Applications Specialist at Quorum Technologies, about sample ...

Scanning electron microscope images of an uncoated soot particle (left) revealing the aggregate structure made up of many tiny spheres, and four different coated soot particles (right) showing ...

The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...

Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800–1000x. For further magnification, scanning electron microscopes (SEMs) can ...

Transmission Electron Microscope: FEI Talos F200s Scanning Transmission Electron Microscope (S/TEM) equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt ...