Portable 3D optical inspection with 4Di InSpec transforms surface metrology, enhancing defect detection and quality assurance ...

Provectron, a smart manufacturing partner focused on high-precision automation, today makes its official U.S. debut at CES in Las Vegas. Designed to support manufacturers looking to localize and ...

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.

Extreme ultraviolet (EUV) lithography is finally in production at advanced nodes, but there are still several challenges with the technology, such as EUV mask defects. Defects are unwanted deviations ...