Two-dimensional (2D) material flakes consist of single to few atomic layers, granting them extraordinary quantum properties, which are not observed in everyday materials. As a result, these materials ...

(Nanowerk News) Two-dimensional (2D) material flakes consist of single to few atomic layers, granting them extraordinary quantum properties, which are not observed in everyday materials. As a result, ...

A new publication from Opto-Electronic Advances, 10.29026/oea.2023.230048 discusses an all-fiber ellipsometer for nanoscale dielectric coatings. Measuring the refractive index and the thickness of ...

a, Schematics of a conventional spectroscopic ellipsometry system. b, Schematics of a metasurface array-based single-shot spectroscopic ellipsometry system. The metasurface array-based system for ...

Flakes of two-dimensional (2D) materials have exceptional quantum qualities that are not seen in common materials since they only have one to a few atomic layers. As a result, these materials have a ...

The MM-16 NIR spectroscopic ellipsometer is dedicated to thin film characterisation determining thickness, optical constants n,k & optical bandgap of materials in the wavelength range 515-1000nm.

The technique of analyzing & measuring the characteristics of the film in a non-destructive and non-contact manner is known as ellipsometry. The device which is used for this purpose is called as an ...

(a) Experimental shift of the 8 TFBG resonances employed in the proposed method. Resonances S1–S4 (top row) correspond to even azimuthal orders, and resonances S5–S8 (bottom row) correspond to odd ...