BALTIMORE — Although the automatic test equipment (ATE) market remains flat on its back due the IC downturn, ATE suppliers this week will try hard to prove their worth by announcing a slew of ...

SAN JOSE, Calif. — Advantest, Amkor, Infineon, Intel, LTX-Credence, Qualcomm, Roos Instruments, Teradyne, and Verigy have come together under a new organization to foster pre-competitive collaboration ...

Rapidly increasing chip and package complexity, coupled with an incessant demand for more reliability, has triggered a frenzy of alliances and working relationships that are starting to redefine how ...

The fundamental challenges of IC test have been the same for a long time. At the heart of all test strategies is controllability and observability. First, control the state of the chip with known test ...

Recent test innovations address components ranging from passive components to integrated circuits. New and enhanced test equipment ranges from bench-top instruments, such as a Keysight impedance ...

Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...

Facing both increasing competitive pressures and rising device complexity, integrated circuit (IC) companies are looking for more effective strategies able to speed delivery to market of higher ...

System-on-chip (SoC) testing presents unparalleled challenges that require a fundamental change in thinking for both IC manufacturers and tester makers. The operating speed of digital logic in ...

AUSTIN, Texas--(BUSINESS WIRE)--NIWeek: NI (Nasdaq: NATI), the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, today announced the NI ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...