SAN JOSE — The worldwide automatic test equipment (ATE) business fell by a staggering 64.2% in 2001 compared to revenues in 2000, but a new wave of chip designs will help pump new life into the ...
BALTIMORE — Although the automatic test equipment (ATE) market remains flat on its back due the IC downturn, ATE suppliers this week will try hard to prove their worth by announcing a slew of ...
Although the term DigRF may lead to initial impressions of a digital signal somehow integrated into an RF signal path, this is not the case. DigRF is a published standard that describes a digital ...
NI (Nasdaq: NATI), the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the NI Semiconductor Test System (STS) series. These ...
Semiconductor test equipment leader Chroma ATE announced that its founder and chairman, Leo Huang, will step down as CEO, handing the role over to I-Shih Tseng, the current president... Semiconductor ...
Rapidly increasing chip and package complexity, coupled with an incessant demand for more reliability, has triggered a frenzy of alliances and working relationships that are starting to redefine how ...
The fundamental challenges of IC test have been the same for a long time. At the heart of all test strategies is controllability and observability. First, control the state of the chip with known test ...
Recent test innovations address components ranging from passive components to integrated circuits. New and enhanced test equipment ranges from bench-top instruments, such as a Keysight impedance ...
Semiconductor test equipment leader Chroma ATE announced that its founder and chairman, Leo Huang, will step down as CEO, handing the role over to I-Shih Tseng, the current president of the integrated ...
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