Stacking chips is making it far more difficult to find existing and latent defects, and to check for things like die shift, leftover particles from other processes, co-planarity of bumps, and adhesion ...

A breakthrough contactless inspection system developed at the University of New South Wales (UNSW) Sydney could soon become the new global standard in solar cell testing – cutting waste, doubling ...

Stephen Neidigk (left), Dennis Roach (center) and Tom Rice of Sandia National Laboratories set up a comparative vacuum monitoring SHM system to allow for remote visual inspection of aircraft ...

Electron-beam inspection is proving to be indispensable for finding critical defects at sub-5nm dimensions. The challenge now is how to speed up the process to make it economically palatable to fabs.