STAR Memory System's New Architecture and Test Algorithms Reduce Test Area up to 30 percent and Increase Coverage for New Memory Defects MOUNTAIN VIEW, Calif., Nov. 6, 2012 -- Synopsys, Inc.
November 9, 2012. Synopsys Inc. has announced a new release of its DesignWare STAR Memory System, an automated pre- and post-silicon memory test, debug, diagnostic and repair solution that enables ...
Some digital design and verification engineers imagine that their colleagues working on analog/mixed-signal (AMS) chips are jealous. After all, the digital development flow has enjoyed the benefits of ...
Discrete memory chips are arguably the most visible reminder of the opportunities and challenges for advanced semiconductor design. They are manufactured in huge quantities, becoming key drivers for ...
Memoir Systems announced their Algorithmic memory awhile ago but its use required a custom design (see Algorithmic Memory Simplifies SoC Memory Subsystem Design). The idea was to take standard single ...
Embedded Dynamic Random Access Memory (eDRAM) design is rapidly evolving to meet the escalating performance and energy efficiency demands of contemporary processors. This technology has emerged as a ...
Optimized memory test and repair algorithms efficiently address new memory defects, including process variation faults and resistive faults, at 20 nanometers (nm) and below New hierarchical ...
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