Scientists at the Fraunhofer Institute for Laser Technology (ILT) have devised a striking new addition to contact stamping technologies in the recently-completed ERDF research project “ScanCut”. In ...
A new method in electron microscopy enables sub-20-picometer targeting of individual atoms without prior exposure, opening the door to atom-specific analysis and control. (Nanowerk Spotlight) ...
Electron-beam inspection is proving to be indispensable for finding critical defects at sub-5nm dimensions. The challenge now is how to speed up the process to make it economically palatable to fabs.
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