Useful for parallel testing of multipin semiconductor devices, the PXIe-4143 SMU (source- measure unit) from National Instruments provides four channels in a single-slot 3U PXI Express module. It also ...
“With the new NI PXIe-4143, our SMU family now gives test engineers DC measurement options for almost any device,” said Ron Wolfe, vice president of semiconductor test at National Instruments. “Our ...
Designed for parallel testing multi pin semiconductor devices, National Instruments' PXIe-4143 is said to feature the highest channel density of any source measurement unit (SMU) on the market. The ...
Discover the power of PXI and PXIe systems in test and measurement. Explore how to harness these modular components and customization options to build tailored solutions. Benefits of customizing PXIe ...
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