For quality control purposes, wafers, such as semiconductor or flat-panel display (FPD) chips, need to be examined under a microscope to verify that they meet specifications related to both circuit ...

Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...

YOKOHAMA—After a decade of development, Canon Inc. began selling lithography equipment for semiconductor production, hoping to reclaim a share in the market. The equipment is used to print fine ...

A new technical paper titled “DECOR: Deep Embedding Clustering with Orientation Robustness” was published by researchers at Oregon State University and Micron Technology. “In semiconductor ...

This technology has been developed to inspect semiconductor wafers and identify flaws and features on a nano-technology scale. However, the sensors, algorithms, neural network systems, optics and ...

Building semiconductors is an incredibly exacting process, with critical dimensions posing significant equipment challenges – and with the possibility that small process excursions can cause the yield ...

YORKTOWN HEIGHTS, N.Y. — IBM Corp. has grown catalyst-free nanotube networks on silicon carbide substrates, the company said last week. With atomic-force microscopy verifying the results, researchers ...