When it comes to test portability between simulation, emulation and silicon, it may be time to consider a higher level of abstraction using graph-based technology. Is it time to move up again? When it ...

In New test points slash ATPG test pattern count, I described a new type of test point technology used with scan compression for device testing. The key benefit of using test points with embedded ...

Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...