Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
In New test points slash ATPG test pattern count, I described a new type of test point technology used with scan compression for device testing. The key benefit of using test points with embedded ...
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Advanced ATPG products support simultaneous analysis of multiple fault models, leverage multi-threading and on-chip compression to improve quality and reduce turnaround time and costs of nanometer ICs ...
Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...
As designs move to smaller nanometer processes, test development is becoming more difficult, effectively impeding product release. Not only are test sets growing at a very high rate, but they are ...
Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...
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