(Nanowerk News) X-ray microscopes are essential for examining components and materials because they can be used to detect changes and details in the material. Until now, however, it has been difficult ...

Subscribe to our newsletter for the latest sci-tech news updates. In a study published in the Journal of Nuclear Materials, LLNL and Lawrence Berkeley National Laboratory scientists described how ...

The left side of the figure shows nanotomography images of an LRTMO particle taken at the TXM of BESSY II before the first charging cycle (top) and after 10 charging cycles (bottom). In the simulation ...

TEM works by transmitting a beam of electrons through an ultra-thin specimen. As the electrons interact with the specimen, they are scattered or transmitted, producing an image that is magnified and ...

A new x-ray microscopy technique permits observation of molecular-scale features less than a nanometer in height. Developed by scientists at the U.S. Department of Energy's Argonne (IL) National ...